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Digital circuit testing and testability Parag K. Lala.

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Material type: Text

TextPublication details: San Diego Academic Press c1997.Description: xii, 199 p. ill. 24 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Status	Date due
Open Shelf	PERPUSTAKAAN POLITEKNIK IBRAHIM SULTAN	Book	TK7874.75 .L35 1997 (Browse shelf(Opens below))	Available

Includes bibliographical references and index.

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