Digital circuit testing and testability
Lala, Parag K. 1948-
Digital circuit testing and testability Parag K. Lala. - San Diego Academic Press c1997. - xii, 199 p. ill. 24 cm.
Includes bibliographical references and index.
0124343309 (alk. paper)
Digital integrated circuits--Testing.
Integrated circuits--Fault tolerance.
Integrated circuits--Very large scale integration--Testing.
Digital circuit testing and testability Parag K. Lala. - San Diego Academic Press c1997. - xii, 199 p. ill. 24 cm.
Includes bibliographical references and index.
0124343309 (alk. paper)
Digital integrated circuits--Testing.
Integrated circuits--Fault tolerance.
Integrated circuits--Very large scale integration--Testing.