Integrated circuit failure analysis (Record no. 117319)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00805nam a2200205 4500 |
| 001 - CONTROL NUMBER | |
| control field | 0000008352 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 231118s9999 xx 000 0 und d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0471974013 |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | PJB |
| 090 00 - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) | |
| Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) | TK7871.852 |
| Local cutter number (OCLC) ; Book number/undivided call number, CALL (RLIN) | .B43 1997 |
| 100 10 - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Beck, Friedrich |
| 240 10 - UNIFORM TITLE | |
| Uniform title | Pra¨parationstechniken fu¨r die Fehleranalyse an integrierten Halbleiterschaltungen. |
| Language of a work | English |
| 245 10 - TITLE STATEMENT | |
| Title | Integrated circuit failure analysis |
| Remainder of title | a guide to preparation techniques |
| Statement of responsibility, etc. | Friedrich Beck ; translated by Stephen S. Wilson |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Chichester ; |
| -- | New York |
| Name of publisher, distributor, etc. | Wiley |
| Date of publication, distribution, etc. | c1998 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xiv, 173 p. |
| Other physical details | ill. |
| Dimensions | 24 cm. |
| 440 #0 - SERIES STATEMENT/ADDED ENTRY--TITLE | |
| Title | Wiley series in quality and reliability engineering |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc. note | Includes bibliographical references and index |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Semiconductors |
| General subdivision | Failures |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Semiconductors |
| General subdivision | Testing |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Book | PERPUSTAKAAN POLITEKNIK IBRAHIM SULTAN | PERPUSTAKAAN POLITEKNIK IBRAHIM SULTAN | 25/06/2009 | TK7871.852 .B43 1997 | 0000021083 | 18/11/2023 | 18/11/2023 | Open Shelf |