Integrated circuit failure analysis a guide to preparation techniques
Beck, Friedrich
Integrated circuit failure analysis a guide to preparation techniques Friedrich Beck ; translated by Stephen S. Wilson - Chichester ; New York Wiley c1998 - xiv, 173 p. ill. 24 cm. - Wiley series in quality and reliability engineering .
Includes bibliographical references and index
0471974013
Semiconductors--Failures
Semiconductors--Testing
Integrated circuit failure analysis a guide to preparation techniques Friedrich Beck ; translated by Stephen S. Wilson - Chichester ; New York Wiley c1998 - xiv, 173 p. ill. 24 cm. - Wiley series in quality and reliability engineering .
Includes bibliographical references and index
0471974013
Semiconductors--Failures
Semiconductors--Testing