000 00541nam a2200169 4500
001 0000008305
008 231118s9999 xx 000 0 und d
020 0 0 _a0122341228
040 _aPJB
090 0 _aTK7874
_b.V56 vol. 22 1990
100 1 0 _aSabnis, Anant G.
245 1 0 _aVLSI reliability
_cAnant G. Sabnis.
260 0 0 _aSan Diego
_bAcademic Press
_c1990.
300 _axiii, 207 p.
_bill.
_c24 cm.
504 0 _aIncludes bibliographical references and index.
650 0 0 _aIntegrated circuits
_xVery large scale integration
_xReliability.
999 _c117178
_d117178