000 | 00658nam a2200217 4500 | ||
---|---|---|---|
001 | 0000004767 | ||
008 | 231118s9999 xx 000 0 und d | ||
020 | 0 | 0 | _a0582237793 |
040 | _aPJB | ||
090 | 0 | 0 |
_aQC53 _b.B44 1995 |
100 | 0 | 0 |
_aBentley, John P. _d1943- |
245 | 0 | 0 |
_aPrinciples of Measurement Systems _cJohn P. Bentley |
250 | 0 | 0 | _a3rd ed. |
260 | 0 | 0 |
_aHarlow [England] _bLongman Scientific & Technical ; _aNew York, NY _bWiley _c1995 |
300 | 0 | 0 |
_axi, 468 p. _bill. _c25 cm. |
500 | 0 | 0 | _aIncludes index |
650 | 0 | 0 | _aAutomatic control |
650 | 0 | 0 | _aEngineering instruments |
650 | 0 | 0 | _aPhysical instruments |
650 | 0 | 0 | _aPhysical measurements |
999 |
_c106564 _d106564 |