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Semiconductor measurements amd instrumentation W.R. Runyan and T.J. Shaffner.

By: Contributor(s): Material type: TextTextPublication details: New York McGraw-Hill 1998Edition: 2nd edDescription: x. 453pISBN:
  • 0070576971
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Item type Current library Collection Call number Status Date due Barcode
Open Shelf PERPUSTAKAAN POLITEKNIK IBRAHIM SULTAN Book QC611.24 .R86 1998 (Browse shelf(Opens below)) Available 0000006313

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