Semiconductor material and device characterization 
Dieter K. Schroder 
 - 2nd ed. 
 - New York  Wiley  c1998 
 - xxiv, 760 p.  ill.  25 cm. 
<br/><br/> "A Wiley-Interscience publication." 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>0471241393 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors<br/>Semiconductors--Testing