TY  - BOOK
AU  - Beck,Friedrich
TI  - Integrated circuit failure analysis: a guide to preparation techniques
SN  - 0471974013
PY  - 1998///
CY  - Chichester, New York
PB  - Wiley
KW  - Semiconductors
KW  - Failures
KW  - Testing
N1  - Includes bibliographical references and index
ER  -