Beck, Friedrich <br/><br/>
Integrated circuit failure analysis  a guide to preparation techniques 
Friedrich Beck ; translated by Stephen S. Wilson 
 - Chichester ;  New York  Wiley  c1998 
 - xiv, 173 p.  ill.  24 cm. 
 - Wiley series in quality and reliability engineering .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>0471974013 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Failures<br/>Semiconductors--Testing