TY  - BOOK
AU  - Lala,Parag K.
TI  - Digital circuit testing and testability
SN  - 0124343309 (alk. paper)
PY  - 1997///
CY  - San Diego
PB  - Academic Press
KW  - Digital integrated circuits
KW  - Testing
KW  - Integrated circuits
KW  - Fault tolerance
KW  - Very large scale integration
N1  - Includes bibliographical references and index
ER  -