Lala, Parag K.  1948- <br/><br/>
Digital circuit testing and testability 
Parag K. Lala. 
 - San Diego  Academic Press  c1997. 
 - xii, 199 p.  ill.  24 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0124343309 (alk. paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital integrated circuits--Testing.<br/>Integrated circuits--Fault tolerance.<br/>Integrated circuits--Very large scale integration--Testing.